Genome-wide association mapping for field spot blotch resistance in South Asian spring wheat genotypes

• 全文链接

南亚春小麦基因型田间斑点病抗性全基因组关联图谱研究

关键词：

来源：

CSSA

全文链接：

//agri.nais.net.cn/topic/downloadFile/84c2d00a-f185-4ad6-86cd-3e9da0aeda01

来源地址：

https://acsess.onlinelibrary.wiley.com/doi/10.1002/tpg2.20425

资源所属：

小麦遗传育种专题

类型：

前沿资讯

语种：

英语

原文发布日期：

2024-01-14

摘要：

Spot blotch caused by Bipolaris sorokiniana ((Sacc.) Shoemaker) (teleomorph: Cochliobolus sativus [Ito and Kuribayashi] Drechsler ex Dastur) is an economically important disease of warm and humid regions. The present study focused on identifying resistant genotypes and single-nucleotide polymorphism (SNP) markers associated with spot blotch resistance in a panel of 174 bread spring wheat lines using field screening and genome-wide association mapping strategies. Field experiments were conducted in Agua Fria, Mexico, during the 2019–2020 and 2020–2021 cropping seasons. A wide range of phenotypic variation was observed among genotypes tested during both years. Twenty SNP markers showed significant association with spot blotch resistance on 15 chromosomes, namely, 1A, 1B, 2A, 2B, 2D, 3A, 3B, 4B, 4D, 5A, 5B, 6A, 6B, 7A, and 7B. Of these, two consistently significant SNPs on 5A, TA003225-0566 and TA003225-1427, may represent a new resistance quantitative trait loci. Further, in the proximity of Tsn1 on 5B, AX-94435238 was the most stable and consistent in both years. The identified genomic regions could be deployed to develop spot blotch-resistant genotypes, particularly in the spot blotch-vulnerable wheat growing areas.