您的位置: 首页 > 外文期刊论文 > 详情页

How to GIWAXS: Grazing Incidence Wide Angle X-Ray Scattering Applied to Metal Halide Perovskite Thin Films

作   者:
Julian A. SteeleEduardo SolanoDavid HardyDamara DaytonDylan LaddKeith WhitePeng ChenJingwei HouHaowei HuangRafikul Ali SahaLianzhou WangFeng GaoJohan HofkensMaarten B. J. RoeffaersDmitry ChernyshovMichael F. Toney
作者机构:
Department of ChemistryKU LeuvenCelestijnenlaan 200FNCD-SWEET beamlineALBA Synchrotron Light SourceCerdanyola del Valles Sweden AustraliacMACSDepartment of Microbial and Molecular SystemsKU LeuvenLeuven 3001Queensland 4072Max Plank Institute for Polymer ResearchD-55128 Mainz GermanySwiss-Norwegian Beamlines at the European Synchrotron RadiationFacility71 Avenue des MartyrsAustralian Institute for Bioengineering and NanotechnologyThe University of QueenslandBrisbane CO 80309 BelgiumMaterials Science and Engineering ProgramUniversity of Colorado BoulderBoulder USARenewable and Sustainable Energy Institute (RASEI)University of Colorado BoulderBoulder Barcelona 08290 Leuven 3001Department of PhysicsBiomolecular and Organic ElectronicsChemistry and Biology (IFM)Linkoeping UniversityLinkoeping 58183School of Mathematics and PhysicsThe University ofQueenslandBrisbane Spain Grenoble F-38000 Queensland 4072 FrancecMACSDepartment of Microbial and Mol
关键词:
synchrotron scienceGIWAXSperovskite solar cellsthin films
期刊名称:
Advanced energy materials
i s s n:
1614-6832
年卷期:
2023 年 13 卷 27 期
页   码:
2300760.1-2300760.50
页   码:
摘   要:
The frequency of reports utilizing synchrotron-based grazing incident wide angle X-ray scattering (GIWAXS) to study metal halide perovskite thin films has exploded recently, as this technique has proven invaluable for understanding several structure-property relationships that fundamentally limit optoelectronic performance. The GIWAXS geometry and temporal resolution are also inherently compatible with in situ and operando setups (including ISOS protocols), and a relatively large halide perovskite research community has deployed GIWAXS to unravel important kinetic and dynamic features in these materials. Considering its rising popularity, the aim here is to accelerate the required learning curve for new experimentalists by clearly detailing the underlying analytical concepts which can be leveraged to maximize GIWAXS studies of polycrystalline thin films and devices. Motivated by the vast range of measurement conditions offered, together with the wide variety of compositions and structural motifs available (i.e., from single-crystal and polycrystalline systems, to quantum dots and layered superlatices), a comprehensive framework for conducting effective GIWAXS experiments is outlined for different purposes. It is anticipated that providing a clear perspective for this topic will help elevate the quality of future GIWAXS studies—which have become routine—and provide the impetus required to develop novel GIWAXS approaches to resolve unsettled scientific questions.
相关作者
载入中,请稍后...
相关机构
    载入中,请稍后...
应用推荐

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充