您的位置: 首页 > 外文期刊论文 > 详情页

Direct protein crystallization on ultrathin membranes for diffraction measurements at X-ray free-electron lasers

作   者:
Opara, NadiaMartiel, IsabelleArnold, Stefan A.Braun, ThomasStahlberg, HenningMakita, MikakoDavid, ChristianPadeste, Celestino
作者机构:
Switzerland C CINAUniv BaselPaul Scherrer Inst CH-5232 Villigen CH-4058 Basel Biozentrum
关键词:
in situ crystallizationtime-resolved measurementnanomembrane chipsX-ray free-electron lasersserial femtosecond crystallography
期刊名称:
Journal of Applied Crystallography
i s s n:
0021-8898
年卷期:
2017 年 50 卷 3 期
页   码:
909-918
页   码:
摘   要:
A new era of protein crystallography started when X-ray free-electron lasers (XFELs) came into operation, as these provide an intense source of X-rays that facilitates data collection in the 'iffract-before-destroy' regime. In typical experiments, crystals sequentially delivered to the beam are exposed to X-rays and destroyed. Therefore, the novel approach of serial crystallography requires thousands of nearly identical samples. Currently applied sample-delivery methods, in particular liquid jets or drop-on-demand systems, suffer from significant sample consumption of the precious crystalline material. Direct protein microcrystal growth by the vapour diffusion technique inside arrays of nanolitre-sized wells is a method specifically tailored to crystallography at XFELs. The wells, with X-ray transparent Si3N4 windows as bottoms, are fabricated in silicon chips. Their reduced dimensions can significantly decrease protein specimen consumption. Arrays provide crystalline samples positioned in an ordered way without the need to handle fragile crystals. The nucleation process inside these microfabricated cavities was optimized to provide high membrane coverage and a quasi-random crystal distribution. Tight sealing of the chips and protection of the crystals from dehydration were achieved, as confirmed by diffraction experiments at a protein crystallography beamline. Finally, the test samples were shown to be suitable for time-resolved measurements at an XFEL at femtosecond resolution.
相关作者
载入中,请稍后...
相关机构
    载入中,请稍后...
应用推荐

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充