Data from: Quantification and optimization of ADF-STEM image contrast for beam sensitive materials

负责人：

关键词：

beam-sensitive materials;Monte Carlo simulations;low contrast materials;image contrast;Scanning transmission electron microscopy;electron dose

DOI：

doi:10.5061/dryad.tq525v7

摘要：

mum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer