David Daomin Zhou,Alexander Istomin,James S. Little,Robert J. Greenberg
申请号：
US14270154
公开号：
US20140327460A1
申请日:
2014.05.05
申请国别(地区):
US
年份:
2014
代理人:
摘要：
The present invention is a system and method for testing the long term reliability of an implantable device. The system provides a vessel containing temperature controlled buffered saline. A support structure suspends a test device in the vessel so it is submerged in the buffered saline and provides mechanical stress on the implantable devices. The test device is eclectically connected to a programmable signal generator and sensors to actively determine the integrity of the device during active testing.
