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SFT DAP THE APPARATUS OF SMART INSTRUMENTAION FOR RADIATION EXPOSURE WITH DOSE AREA PRODUCT METER SFT
专利权人:
SANS FRONTIER TECHNOLOGY
发明人:
CHAE, HYOUN SIK,채현식,CHAE, HYOUN SIKKR
申请号:
KR1020160169678
公开号:
KR1017689060000B1
申请日:
2016.12.13
申请国别(地区):
KR
年份:
2017
代理人:
摘要:
Disclosed is a hybrid-type radiation exposure measurement apparatus comprising an SFT-type DAP measuring instrument and an organic scintillator-type radiation sensor part. The hybrid-type radiation exposure measurement apparatus comprises: the SFT-type DAP measuring instrument (100) of primarily measuring dose change according to the change of a cross-sectional area of an X-ray beam and transmitting the measured dose change to a smart control part; the organic scintillator-type radiation sensor part (200) of radiating the X-ray beam to the organic scintillator to reflect light of a specific wavelength, secondarily measuring a scintillation light signal according to the X-ray beam, and transmitting the secondarily measured scintillation light signal to the smart control part; a battery part (300) supplying power to each device; a short-distance communication module (400) of transmitting current effective dose exposure data and emergency situation notification messages; a display part (500) of displaying the current effective does exposure data and the emergency situation notification messages in real-time; a wired/wireless communication module (600) of transmitting the current effective does exposure data and the emergency situation notification messages, receiving a control instruction signal as a response signal for the transmission, and transmitting the received signal to the smart control part; and the smart control part (700) of controlling to transmit the current effective dose exposure data and the emergency situation notification messages to the short-range communication module and the wired/wireless communication module when the current effective dose exposure data is compared with a reference dose, and it is determined that the current effective dose exposure data is equal to or greater than the reference value. According to the present invention, the relationship between an X-ray dose and the obtained charge quantity counter can be clearly distinguished.본
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