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Method for tracing distribution of moving ions in ion mobility spectrometer
专利权人:
GRADUATE SCHOOL AT SHENZHEN, TSINGHUA UNIVERSITY
发明人:
Ni Kai,Guo Kaitai,Yu Quan,Tang Binchao,Yu Zhou,Qian Xiang,Wang Xiaohao
申请号:
US201715486040
公开号:
US10161904(B2)
申请日:
2017.04.12
申请国别(地区):
美国
年份:
2018
代理人:
Hamre, Schumann, Mueller & Larson, P.C.
摘要:
A method for tracing a distribution of moving ions in an ion mobility spectrometer is provided, including steps: first selecting a sample having light-emitting characteristics as a tracing sample; subsequently, ionizing the tracing sample by using an ionization source, and feeding ions of the tracing sample to a drift tube of the ion mobility spectrometer; using a plate to collect the ions at a cross section to be detected; and finally processing the ions collected on the plate by using an appropriate means, thereby enabling the ions to emit light, and displaying a distribution view of movement positions of the ions on the cross section. By combining a light-emitting tracing means and movements of charged ions in an ion mobility spectrometer, it is able to master a position distribution of the charged ions in the ion mobility spectrometer more intuitively and practically.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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