Imaging by attenuated total reflectance (ATR)

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专利权人:

SIEMENS AKTIENGESELLSCHAFT

发明人:

Florian Benedikt Geiger,Martin Kördel,Anton Schick

申请号：

US14899092

公开号：

US09702820B2

申请日:

2014.03.05

申请国别(地区):

US

年份:

2017

代理人:

摘要：

An arrangement for attenuated total reflectance (ATR) infrared spectroscopy uses a reflection matrix for location-resolved spectroscopy of aqueous and/or powdery samples with a high signal-to-noise ratio and without previous complex preparation of the samples. The method of using the reflection matrix produces imaging of the sample with a high signal strength.

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