SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY; CHINESE ACADEMY OF SCIENCES
发明人:
Tiexiang WEN,Jia GU,Yaoqin XIE,Lei WANG
申请号：
US15519531
公开号：
US20170245837A1
申请日:
2015.12.31
申请国别(地区):
US
年份:
2017
代理人:
摘要：
An ultrasound probe calibration system and method. The system comprises an ultrasound probe calibration phantom (100), and the ultrasound probe calibration phantom (100) is provided with a sunken recess (110) at a middle position of an upper surface thereof and with several conical holes on a side surface thereof. The sunken recess (110) is fixedly connected with a two dimensional ultrasound probe (220) therein. The conical hole is inserted with an NDI insertion stylus (230), and a tip of the NDI insertion stylus (230) can be acquired in ultrasound imaging. An ultrasound probe calibration system employing the above structure enables a midplane of an ultrasound plane to pass a midplane of an ultrasound probe calibration phantom (100) along a middle gap, such that a tip of an NDI insertion stylus (230) is used for the midplane of the ultrasound plane, thereby addressing the problem of misalignment of a point-type phantom or a two-dimensional plane-type phantom to the ultrasound plane.
