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Spectral calibration of spectral computed tomography (CT)
专利权人:
GENERAL ELECTRIC COMPANY
发明人:
Yannan Jin,Geng Fu,Peter M. Edic,Hewei Gao
申请号:
US15273043
公开号:
US10507005B2
申请日:
2016.09.22
申请国别(地区):
US
年份:
2019
代理人:
摘要:
There is set forth herein a method including performing with an X-ray detector array of a CT imaging system one or more calibration scans, wherein the one or more calibration scans include obtaining for each element of the first through Nth elements of the X-ray detector array one or more calibration measurements; and updating a spectral response model for each element of the first through Nth elements using the one or more calibration measurements. In another aspect, a CT imaging system can perform imaging, e.g. including material decomposition (MD) imaging, using updated spectral response models for elements of an X-ray detector array. The spectral response models can be updated using a calibration process so that different elements of an X-ray detector array have different spectral response models.
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