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Crystalline forms of a parp inhibitor compound
专利权人:
CEPHALON INC
发明人:
KRESS MICHAEL,HE LINLI,COURVOISIER LAURENT,JACOBS MARTIN J,PETRAITIS JOSEPH,BIERLMAIER STEPHEN,HALTIWANGER R. CURTIS,MOWREY DALE R,MCKEAN ROBERT E,FIELD R. SCOTT,YAZDANIAN MEHRAN,CHRISTIE MICHAEL
申请号:
NZ59888310
公开号:
NZ598883A
申请日:
2010.08.25
申请国别(地区):
NZ
年份:
2014
代理人:
摘要:
Disclosed are crystalline forms of 4,5,6,7-tetrahydro-11-methoxy-2-[(4-methyl-1-piperazinyl)methyl]-1H-cyclopenta[a]pyrollo[3,4-c]carbazole-1,3(2H)-dione (Compound I), wherein the crystalline form of Compound I is characterized by (a) an X-ray powder diffraction pattern comprising at least the following peaks: 4.32, 6.07 and 8.55 ± 0.2 degrees 2-theta, and one or more of the following peaks: 12.07 and 15.37 ± 0.2 degrees 2-theta (form A0); (b) an X-ray powder diffraction pattern comprising at least the following peaks: 7.16, 7.89 and 16.54 ± 0.2 degrees 2-theta, and one or more of the following peaks: 10.77 and 21.20 ± 0.2 degrees 2-theta (form B0); (c) an X-ray powder diffraction pattern comprising at least the following peaks: 8.36, 17.39 and 24.59 ± 0.2 degrees 2-theta, and one or more of the following peaks 8.71 and 16.69 ± 0.2 degrees 2-theta (form HC0); (d) a compound of formula I characterized by an X-ray powder diffraction pattern comprising at least the following peaks: 7.60, 8.99, 15.16, 17.99 and 25.00 ± 0.2 degrees 2-theta (form HD0); (e) an X-ray powder diffraction pattern comprising at least the following peaks: 8.56, 14.64, 16.07, 22.24 and 23.02 ± 0.2 degrees 2-theta, and one or more of the following peaks: 9.80, 10.62, 11.04, 12.68, 17.18, 17.23, 19.75, 23.31, 27.06 and 27.85 ± 0.2 degrees 2-theta (form S20); (f) a compound of formula I characterised by an X-ray powder diffraction pattern comprising at least the following peaks: 6.70, 8.67 and 16.80 ± 0.2 degrees 2-theta, and one or more of the following peaks: 7.61, 10.29, 11.57, 13.36, 15.02, 16.85, 17.33 and 25.20 ± 0.2 degrees 2-theta (form S30); (g) a compound of formula I characterised by an X-ray powder diffraction pattern comprising at least the following peaks: 8.42, 8.60 and 13.92 ± 0.2 degrees 2-theta, and one or more of the following peaks: 7.95, 17.20, 21.07, 21.30 and 24.46 ± 0.2 degrees 2-theta (form S40); (h) a compound of formula I characterised by an X-ray powder diffraction patter
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