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METHOD AND APPARATUS FOR MEASURING ANESTHETIC DEPTH
专利权人:
Charm Engineering Co.; Ltd.
发明人:
CHANG, Ho-Jong,KIM, Eung Hwi,PARK, Sang Hyun,HONG, Seung Kyun,KIM, Kwang Moo
申请号:
DK14751919
公开号:
DK2962634T3
申请日:
2014.02.13
申请国别(地区):
DK
年份:
2018
代理人:
摘要:
The present invention rapidly reacts to changes in the degree of anesthesia to provide an accurate and timely anesthetic depth measurement result, and a method for measuring anesthetic depth comprises the steps of: an epoch dividing portion generating an epoch signal by dividing a EEG signal into a plurality of numbers based on time units, a coefficient portion extracting a CAI calculation value (CAI) by calculating the number of points in an epoch having a value higher than an established critical value, a Shannon entropy calculating portion extracting a Shannon entropy calculation value (ShEn) by conducting a Shannon entropy-calculation from the EEG signal, and a spectra entropy calculating portion extracting a spectra entropy value (SpEn) by conducting a spectra entropy calculation; an improved Shannon entropy extracting portion extracting an improved Shannon entropy calculation value (MshEn) by multiplying the Shannon entropy calculation value (ShEn) and the spectra entropy calculation value (SpEn); and a CAI extracting portion extracting an anesthetic depth index (MsCAI) through logical operating of the improved Shannon entropy calculation value(MshEn) and the CAI calculation value (CAI).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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