您的位置: 首页 > 农业专利 > 详情页

Metal artefact prevention during needle guidance under (Xper) CT
专利权人:
Nicolaas Jan Noordhoek
发明人:
Nicolaas Jan Noordhoek
申请号:
US12514337
公开号:
US09545232B2
申请日:
2007.10.30
申请国别(地区):
US
年份:
2017
代理人:
摘要:
The present invention relates to a method and device for preventing metal artifacts computer tomography scans made during biopsy taking, when a metal needle is present in the field of view of a scan. The direction of the metal needle and the direction of the electro-magnetic field are determined in advance. For the determination of the electro-magnetic field a position of a source of the electro-magnetic field a position of a detector are considered. The user may be warned, when the determined direction of the electro-magnetic field and of the direction of the metallic needle correspond to each other.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充