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Systems and methods for providing beam scan patterns for high speed doppler optical frequency domain imaging
专利权人:
Benjamin J. Vakoc
发明人:
Benjamin J. Vakoc,Guillermo J. Tearney,Brett E. Bouma
申请号:
US12183630
公开号:
US09375158B2
申请日:
2008.07.31
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An exemplary apparatus and/or an exemplary method can be provided using which, it is possible (e.g., with at least one first arrangement) to measure an amplitude and/or a phase of at least one electromagnetic radiation provided from a particular portion of a sample. Further, it is possible (e.g., using at least one second arrangement) to scan a location of the particular portion along a path from a first point of the sample to a second point of the sample. In addition, it is possible to control the scan (e.g., with the second arrangement) such that the scan may comprise at least one first segment having a positive velocity and at least one segment having a negative velocity. A first distance of the first segment and/or the second segment can be smaller than a second distance between the first and second points.
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中国工程科技知识中心
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