A bundled electron beam (BEB) (14) is controlled regarding its excursion in its direction by two pairs of plate electrodes (17.1,17.218.1,18.2) that operate vertically to each other. The BEB can use appropriate control of these plate electrodes to scan an anode (16) like scanning a TV picture line by line with a desirable gap and, as a result, can generate desired X-rays. Independent claims are also included for the following: (1) An X-ray system for generating projective phase-contrast exposures (2) A method for generating projective or tomographic X-ray phase-contrast exposures of an object under examination with the help of a focus-detector system.
