A system for use in monitoring parameters of an object is described. The system comprising an illumination unit configured for providing coherent illumination of a predetermined wavelength range and for directing said coherent illumination onto an inspection region of the object, and a collection unit comprising a lens arrangement and a detector array and configured for collecting light returning from the inspection region and for generating one or more image data pieces associated with speckle patterns generated at an intermediate plane between the inspection region and said detector array. The detector array is configured as a rolling shutter type detector unit and said collection unit comprises at least one light splitting element configured for splitting collected light to thereby form a plurality of image replications corresponding to said speckle patterns on said detector array.
