Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials

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专利权人:

LOCKHEED MARTIN CORPORATION

发明人:

Villani, Jr. Joseph A.,Stetson, Jr. John B.

申请号：

US201615003145

公开号：

US10088452(B2)

申请日:

2016.01.21

申请国别(地区):

美国

年份:

2018

代理人:

Foley & Lardner LLP

摘要：

A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material includes a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.

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中国工程科技知识中心

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http://www.ckcest.cn/home/