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Systemy i sposoby obrazowania przy użyciu absorpcji
专利权人:
Massachusetts Institute of Technology
发明人:
HART, DOUGLAS P.,FRIGERIO, FEDERICO,MARINI, DAVIDE M.
申请号:
PL09801080
公开号:
PL2300808T3
申请日:
2009.07.24
申请国别(地区):
PL
年份:
2014
代理人:
摘要:
The attenuation and other optical properties of a medium are exploited to measure a thickness of the medium between a sensor and a target surface. Disclosed herein is a device comprising: a luminescent layer of a material adapted to form a conforming layer when placed over a target surface of an object, the luminescent layer configured to emit light at a first wavelength and a second wavelength; a sensor positioned to capture an intensity of the first wavelength and an intensity of the second wavelength in a direction of a location on the target surface; an absorbing medium, the medium positioned between the sensor and the luminescent layer and the medium absorbing the first wavelength more than the second wavelength; and a processor programmed to calculate a thickness of the medium in the direction of the location based upon a function of the intensity of the first wavelength and the intensity of the second wavelength.
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