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X線透視撮影装置、X線透視画像の残像補正方法、および、プログラム
专利权人:
株式会社日立製作所
发明人:
藤川 真里,天明 宏之助,万木 貴宏,中村 正
申请号:
JP2015093401
公开号:
JP6310415B2
申请日:
2015.04.30
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
Provided is an X-ray fluorography apparatus and an afterimage correction method for X-ray fluoroscopic image, which can correct the afterimage component with high accuracy even when photographing and perspective are alternately repeated. Each time an X-ray photographic image is obtained, a photographed afterimage image is obtained for each pixel corresponding to the afterimage image obtained after the current image acquisition and the afterimage image obtained after the previous image acquisition. The value of the decay of a pixel value of an image is obtained from a function of time. Then, the pixel value of the perspective image obtained after this photographing is subtracted from the calculated attenuation value, thereby removing the afterimage.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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