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Ophthalmic device and ophthalmic imaging method
专利权人:
キヤノン株式会社
发明人:
小野 光洋
申请号:
JP2012247025
公开号:
JP6124556B2
申请日:
2012.11.09
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
In order to prevent inaccurate position detection caused by overlapping between a position alignment index and an optic papilla of a fundus in position alignment between an eye to be inspected and an apparatus when a fundus image is photographically captured, an ophthalmologic apparatus includes: a projection unit configured to project a plurality of alignment indices onto an eye to be inspected; an optic papilla position detection unit configured to detect an optic papilla position of the eye to be inspected; and an alignment detection unit configured to detect a positional relation between the eye to be inspected and an apparatus main body from a reflection image of the alignment index, wherein the alignment detection unit performs alignment detection by selecting a reflection image of at least one of the reflection images of the plurality of alignment indices depending on the optic papilla position.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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