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X-RAY IMAGE PROCESSING METHOD AND X-RAY IMAGE PROCESSING APPARATUS
专利权人:
SAMSUNG ELECTRONICS CO.; LTD.
发明人:
Jaemock YI,Chaeyeong Lee
申请号:
US16751319
公开号:
US20200237319A1
申请日:
2020.01.24
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An X-ray image processing method, including obtaining a first X-ray image of an object including a plurality of materials including a first material and a second material; obtaining a first partial image generated by imaging the first material and a second partial image generated by imaging the first material overlapping the second material from the first X-ray image; obtaining first information related to a stereoscopic structure of the first material, based on the first partial image included in the first X-ray image; and obtaining second information about the second material based on the first information and the second partial image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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