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CAPACITANCE MEASURING AND IMAGING SENSOR SYSTEM
专利权人:
Michael L. MATHIASMEIER;Dwayne Leroy Mason
发明人:
Michael L. MATHIASMEIER,Dwayne Leroy Mason
申请号:
US15677012
公开号:
US20180140226A1
申请日:
2017.08.15
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Embodiments disclosed herein provide methods, apparatus and computer systems comprising an input unit for inputting one or more data sets to be processed comprising a capacitance measuring device configured to measure one or more conductive elements on a sensor plane and provide a corresponding data set of measurements obtained from the conductive elements. A computing unit is coupled to the input unit and for processing the data sets; the computing unit comprises at least one processor with non-transient memory. An output unit is connected to the computing unit for outputting data received from the computing unit. A computer program stored in memory comprising instructions that cause the computer to isolate and discharge conductive and reference impedance elements, perform a charge transfer to the one or more conductive elements on the sensor plane, measure the relative difference between the conductive elements and reference impedance element, and store measurements in non-transient memory.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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