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X-RAY CT MEASURING APPARATUS AND CALIBRATION METHOD THEREOF
专利权人:
MITUTOYO CORPORATION
发明人:
Hidemitsu ASANO,Masato KON
申请号:
US16250201
公开号:
US20190223826A1
申请日:
2019.01.17
申请国别(地区):
US
年份:
2019
代理人:
摘要:
An X-ray CT measuring apparatus configured to emit an X-ray from an X-ray source while rotating a subject arranged on a rotary table, and obtain a tomographic image of the subject by reconstructing projection images, includes an X-ray fluctuation calibration jig arranged in an X-ray field of view, a detection unit configured to detect fluctuations in an X-ray focal position by using an X-ray projected image of the X-ray fluctuation calibration jig, and a correction unit configured to correct an X-ray projection image of the subject by using the detected fluctuations in the X-ray focal position.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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