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Grain quality sensor
专利权人:
Appareo Systems, LLC
发明人:
Schleusner Bradley K.,Bremer Marshall T.,Butts Nicholas L.
申请号:
US201715702621
公开号:
US10085379(B2)
申请日:
2017.09.12
申请国别(地区):
美国
年份:
2018
代理人:
Law Office of Mark Brown, LLC `Brown Mark E.
摘要:
A grain quality sensor comprising a photosite array, an illumination source, a filter, and an electronics module, wherein the illumination source directs light onto a crop sample, wherein the filter limits passage of light into different parts of the photosite array such that certain locations on the photosite array only receive certain wavelengths of light reflected or fluoresced by the crop sample, wherein an electronics module is electrically connected to the photosite array and capable of determining which parts of the photosite array received light and the wavelengths of the light received, wherein the electronics module can analyze the optical data received by the photosite array, and wherein the analysis of the optical data is used to determine the composition of the crop sample.
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