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検査装置及びブリスタ包装機
专利权人:
CKD株式会社
发明人:
大山 剛,坂井田 憲彦,田口 幸弘
申请号:
JP2016038600
公开号:
JP6444913B2
申请日:
2016.03.01
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an inspection device capable of performing inspection on the embedment position, number, attitude, and shape of an IC tag embedded in a content, while achieving the improvement of inspection efficiency and the suppression of the increase of cost and to provide a blister packaging machine.SOLUTION: An IC tag inspection device 23 includes illumination devices 51 and 52 which irradiate a tablet 5 stored in the pocket part 2 of a container film 3 with predetermined light and cameras 61 and 62 which are provided on a side opposite to the illumination devices 51 and 52 through the container film 3 and can image light from the illumination devices 51 and 52 at least transmitted through the tablet 5. The IC tag inspection device 23 specifies a shadow part corresponding to an IC tag 6 in a transmission image obtained by the cameras 61 and 62, performs the inspection on the basis of a specification result, and determines the quality of the tablet 5 on the basis of an inspection result.SELECTED DRAWING: Figure 5COPYRIGHT: (C)2017,JPO&INPIT
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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