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SYSTEMS AND METHODS FOR CORRECTING OPTICAL REFLECTANCE MEASUREMENTS
专利权人:
UNIVERSITY OF MASSACHUSETTS
发明人:
SOLLER, BABS R.,YANG, YE,SHEAR, MICHAEL A.,SOYEMI, OLUSOLA O.
申请号:
EP06758654
公开号:
EP1875128A4
申请日:
2006.04.25
申请国别(地区):
EP
年份:
2012
代理人:
摘要:
We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source (b) a detection system (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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