您的位置: 首页 > 农业专利 > 详情页

Systems and methods for sample inspection and review
专利权人:
KLA—Tencor Corporation
发明人:
Lewis Isabella T.,Bobrov Yakov
申请号:
US201313779062
公开号:
US9939386(B2)
申请日:
2013.02.27
申请国别(地区):
美国
年份:
2018
代理人:
Suiter Swantz pc llo
摘要:
The disclosure is directed to systems and methods for sample inspection and review. In some embodiments, images are collected and/or defects are located utilizing separately addressable red, green, and blue (RGB) illumination sources to improve image quality. In some embodiments, illumination sources are pulse width modulated for substantially consistent light intensity in presence of variable sample motion. In some embodiments, a stage assembly is configured to support the sample without blocking access to the supported surface of the sample, and further configured to reduce oscillations or vibrations of the sample. In some embodiments, an illumination system includes an imaging path and a focusing path to allow full field of view focusing.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充