Abhishek KUMAR,Alexandre R. TUMLINSON,Rainer LEITGEB
申请号：
US14164955
公开号：
US20140218684A1
申请日:
2014.01.27
申请国别(地区):
US
年份:
2014
代理人:
摘要：
Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present invention, a fast and simple way to correct for defocus aberration is described. A variety of applications for the inventive method are presented.
