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X-ray radiation detector with automatic exposure control
专利权人:
Ami Ben Hayun
发明人:
Ami Ben Hayun,Alex Shtengel,Guy Hevel
申请号:
US13471970
公开号:
US09201149B2
申请日:
2012.05.15
申请国别(地区):
US
年份:
2015
代理人:
摘要:
An apparatus and method for radiation detection is herein described. The apparatus consists of two radiation-detection arrays: A primary radiation-detection array, based on scintillator-CMOS design, and a secondary radiation-detection array, mounted on the back of said primary array. A method of controlling the detection operation is described, where output of the secondary array is exploited for controlling the acquisition-start and acquisition-stop of the primary array. Further, the apparatus is equipped with fast memory for storage of correction tables, and with a processor for fast computation of the correction. A method of calibration is also describes with tables for: offset correction, gain correction, and for defect-pixel correction. These tables are evaluated by the fast processor and stored on the fast memory. A method of real-time evaluation of the signal corrections is described, which depends on the acquisition-start and acquisition-stop timings and which results a clean, artifact-free image.
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