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光測定装置
专利权人:
KONICA MINOLTA INC
发明人:
MASHIMA MASANAO,真島 雅尚
申请号:
JP2012121513
公开号:
JP2013244313A
申请日:
2012.05.29
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
PROBLEM TO BE SOLVED: To prevent illumination light from unfavorably affecting the spectrum analysis of to-be-measured light, and at the same time, to enable a user to easily use the apparatus even when an observation and a measurement are performed.SOLUTION: A light measuring apparatus 1 includes: a first light source 54 which emits excitation light a second light source 56 which emits illumination light a probe 30 which is installed under a cable form a light detector 55 which measures the light amount of at least a specified wavelength of the light which has been transmitted to the proximal end of the probe 30 and a control section 60. The control section 60 performs a proximity decision process, a second light source turning-off process, a measurement control process, and a second light source turning-on process. In this case, in the proximity decision process, the presence/absence of the approaching between the distal end of the probe 30 and a measurement objective article is decided when the second light source 56 is turned on. In the second light source turning-off process, the second light source 56 is turned off when the decision of the proximity decision process means the presence of the proximity. In the measurement control process, the light detector 55 is made to perform the measurement under a state in which the first light source 54 is turned on after the second light source turning-off process. In the second light source turning-on process, the second light source 56 is turned on after the measurement control process.COPYRIGHT: (C)2014,JPO&INPIT【課題】照明光が被測定光のスペクトル解析に悪影響を及ぼさないようにするとともに、観察と測定を行う場合においてもユーザーが簡単に装置を使用できるようにする。【解決手段】光測定装置1は、励起光を発する第一光源54と、照明光を発する第二光源56と、ケーブル状に設けられたプローブ30と、プローブ30の基端まで伝達した光の少なくとも特定波長の光量を測定する光検出器55と、制御部60と、を備える。制御部60が、第二光源56が点灯している時にプローブ30の先端と測定対象物の近接の有無を判定する近接判定処理と、近接判定処理の判定が近接の旨である場合に第二光源56を消灯する第二光源消灯処理と、第二光源消灯処理後に第一光源54を点灯した状態で光検出器55に測定を行わせる測定制御処理と、測定制御処理後に第二光源56を点灯する第二光源点灯処理と、を実行する。【選択図】図1
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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