The disclosure relates to a system for determining characteristic values of ametropia of a test person, comprising a device for generating optical test structures and a device for observing the test structures by the test person, said device comprising a correction unit for correcting possible ametropia phenomena of the test person. According to the disclosure, the optical test structures have at least two moving speckle patterns of different wavelengths. The disclosure further relates to a corresponding device for generating optical test structures for determining characteristic values of ametropia of a test person, and to a corresponding method for determining characteristic values of ametropia of a test person.
