您的位置: 首页 > 农业专利 > 详情页

MEASURING SYSTEM AND METHOD FOR MEASURING AN IMPLANT-IMPLANT SITUATION
专利权人:
SIRONA DENTAL SYSTEMS GMBH
发明人:
Joachim PFEIFFER,Frank THIEL
申请号:
US16317667
公开号:
US20190282343A1
申请日:
2017.07.21
申请国别(地区):
US
年份:
2019
代理人:
摘要:
The invention relates to a measuring system for measuring an implant-implant situation for planning an implant-supported tooth replacement part supported on at least two implants, comprising a scanning template and the at least two set implants. The scanning template has cut-outs for the individual implants, wherein first markings are arranged on surface regions around the cut-outs.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充