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Charged particle beam irradiation apparatus
专利权人:
发明人:
申请号:
EP05021071.5
公开号:
EP1642617B2
申请日:
2005.09.27
申请国别(地区):
EP
年份:
2016
代理人:
摘要:
To ensure irradiation accuracy and safety, even when an irradiation device employing a different irradiation method is used, disclosed is herein a charged particle beam irradiation apparatus that irradiates an irradiation target with charged particle beams includes:a charged particle beam generator for generating the charged particle beams a passive scattering irradiation device and a scanning irradiation device, both for irradiating the irradiation target with the charged particle beams a beam transport system for transporting the charged particles beam extracted from the charged particle beam generator, to selected one of the two irradiation devices and a central controller that modifies operating parameters on the charged particle beam generator, according to the irradiation method adopted for the selected irradiation device.
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