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INSPECTION OF COMPONENTS FOR IMPERFECTIONS
专利权人:
REDLUX LIMITED
发明人:
NESBITT, John,GONZALEZ LLORENTE, Sergio
申请号:
WO2018EP54091
公开号:
WO2018177655(A1)
申请日:
2018.02.20
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
An inspection method for optical components that can be implemented to conform to performance specification MIL-PRF-13830 in order to grade surface imperfections, in particular scratches and digs. A dark-field microscope obtains a digital image of the component, and this digital image is processed to determine scratch and dig numbers. For scratches, the number is obtained by dividing the total intensity of the scratch by the scratch length. For digs, the number is obtained by determining dig diameter or by dividing the dig's total intensity by its area. According to our extensive testing, this automated digital image processing approach appears to faithfully mimic the subjective impression that a scratch makes on an expert inspector who is applying the visibility test of MIL-PRF-13830.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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