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PARTICLE BEAM IRRADIATION APPARATUS AND PARTICLE BEAM TREATMENT APPARATUS
专利权人:
MITSUBISHI ELECTRIC CORPORATION
发明人:
IWATA TAKAAKI
申请号:
EP09848726
公开号:
EP2471577A4
申请日:
2009.08.27
申请国别(地区):
EP
年份:
2014
代理人:
摘要:
The objective is to eliminate the effect of the hysteresis of a scanning electromagnet so that there is obtained a particle beam irradiation system that realizes high-accuracy beam irradiation. There are provided a magnetic-field sensor (20) that measures the magnetic field of a scanning electromagnet (3) and an irradiation control apparatus (5) that controls the scanning electromagnet (3) based on a measurement magnetic field Bs measured by the magnetic-field sensor (20) and target irradiation position coordinates Pi of a charged particle beam (1b). The irradiation control apparatus (5) is provided with an inverse map means (22) that calculates a target magnetic field Bi, based on the target irradiation position coordinates Pi of the charged particle beam (1b) and a compensator (23) that outputs a control input Io, to the scanning electromagnet (3), for controlling the magnetic-field error Be between the target magnetic field Bi and the measurement magnetic field Bs to be the same as or smaller than a predetermined threshold value.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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