您的位置: 首页 > 农业专利 > 详情页

顱內腦波異常發生位置之偵測系統
专利权人:
CHUNG SHAN MEDICAL UNIVERSITY HOSPITAL
发明人:
HSIN, YUE-LOONG,辛裕隆,PENG, SYU-JYUN,彭徐钧,彭徐鈞
申请号:
TW105132496
公开号:
TW201813583A
申请日:
2016.10.07
申请国别(地区):
TW
年份:
2018
代理人:
摘要:
The present invention captures a plurality of voltage variation waveform signals by using a plurality of electrodes in the brain. In addition, a processing unit is provided to obtain a plurality of voltage difference variation waveforms by subtracting any adjacent voltage variation waveform signals. Each voltage difference variation waveform is further categorized into a first frequency band waveform signal and a second frequency band waveform signal; and then a plurality of corresponding first frequency band contour waveform signals and second frequency band contour waveform signals are respectively obtained; each first frequency band contour waveform signal and the plurality of second frequency band contour waveform signals are sequentially analyzed for the degree of correlation to obtain a degree of correlation data table for detecting locations of abnormal intracranial brainwaves. The present invention has the advantages of scientifically identifying the locations of abnormal intracranial brainwaves by using a unique processing method, and quantifiably displaying abnormalities by using a degree of correlation data table.本發明係以腦部內之複數電極部擷取複數電壓變化波形訊號。並設處理單元將任意相鄰之電壓變化波形訊號相減而得到複數個電壓差變化波形。進一步將每一電壓差變化波形分頻為一第一頻段波形信號及一第二頻段波形信號;再分別取得相對應之複數第一頻段輪廓波形信號與第二頻段輪廓波形信號;將每一第一頻段輪廓波形信號與複數個第二頻段輪廓波形信號依序進行相關程度分析得到一相關程度數據表,用以偵測出顱內腦波異常發生位置。本案兼具利用獨特處理方式能科學的找出顱內腦波異常發生位置,與可以相關程度數據表具體量化呈現等優點。
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充