您的位置: 首页 > 农业专利 > 详情页

Wavelength swept light source device and measuring device
专利权人:
株式会社トーメーコーポレーション
发明人:
加藤 千比呂,野澤 有司
申请号:
JP2014041599
公开号:
JP6306374B2
申请日:
2014.03.04
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
A wavelength-swept light source apparatus comprises a light source that emits a wavelength-swept light that varies in a predetermined cycle, a mode hop detector that detects a mode hop of the wavelength-swept light emitted from the light source; and a control unit that controls at least one of a parameter that defines a specified period having a predetermined fixed or variable time length provided in the predetermined cycle and a control parameter of the light source, thereby to set an occurrence timing of the mode hop detected by the mode hop detector outside of the specified period. The wavelength-swept light source is used as input light source for an interferometric measuring system. In one embodiment the mode hop detector and the detector of the interferometric signal are the same detector.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充