Jongsik Kim,Bin Cao,Song Mei,Kinpui Chan,Zhenguo Wang,Zaixing Mao
申请号：
US16829673
公开号：
US20200309510A1
申请日:
2020.03.25
申请国别(地区):
US
年份:
2020
代理人:
摘要：
An interferometric method of identifying the thickness of an object that is too thin to be resolved by a Fourier transform of the interference signal includes applying a harmonic frequency modulation to an envelope of the interference signal. Where the object is a tear film, this method may be utilized to determine a thickness of the lipid layer of the tear film.
