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MICROPARTICLE ANALYZING DEVICE AND MICROPARTICLE ANALYZING SYSTEM
专利权人:
Sony Corporation
发明人:
BRUN Marcaurele,SATO Kazumasa,OMORI Shinji,KATSUMOTO Yoichi
申请号:
EP20130874597
公开号:
EP2955512(B1)
申请日:
2013.12.26
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
There is provided a microparticle analysis apparatus including a sample channel configured to receive liquid containing a plurality of microparticles, a first pair of electrodes configured to form an alternating electric field in at least a part of the sample channel, a measuring part configured to measure impedance between the first pair of electrodes, an analyzing part configured to calculate property values of the microparticles from the impedance measured in the measuring part, and a determining part configured to determine whether data of the impedance measured in the measuring part is derived from the microparticles.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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