Method for detecting crystal grain boundaries of grapheme and device using method
- 专利权人:
- Hanwha Techwin Co., Ltd.
- 发明人:
- Lee Eunkyu,Yoon Jonghyuk
- 申请号：
- US201314771834
- 公开号：
- US10006893(B2)
- 申请日:
- 2013.11.29
- 申请国别(地区):
- 美国
- 年份:
- 2018
- 代理人:
- Sughrue Mion, PLLC
- 摘要：
- Provided are a method of detecting a grain boundary of graphene and a device using the same.
- 来源网站：
- 中国工程科技知识中心
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