Provided are an analytical method and an analytical system with which impurities, such as nonmetallic elements, contained in a sample, e.g., an organic semiconductor material, can be easily detected precisely with high sensitivity. The method comprises: the step of bringing an organic semiconductor material into contact with supercritical water or subcritical water; and the step of detecting any nonmetallic element contained in the supercritical water or subcritical water which has been contacted with the organic semiconductor material. By the method, an organic semiconductor material which is solid is analyzed for nonmetallic elements.
