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Method for measuring scanning pattern of optical scanning apparatus, apparatus for measuring scanning pattern, and method for calibrating image
专利权人:
OLYMPUS CORPORATION
发明人:
Mitsuru Namiki
申请号:
US15708269
公开号:
US10488647B2
申请日:
2017.09.19
申请国别(地区):
US
年份:
2019
代理人:
摘要:
An apparatus for measuring a scanning pattern of an optical scanning apparatus can easily reduce the effect of stray light and improve the measurement accuracy of the scanning pattern. An apparatus for measuring a scanning pattern of an optical scanning apparatus (100), which scans an object being illuminated with illumination light and generates a display image of the object being illuminated, includes a screen (11) scanned by the illumination light and an optical position detector (12) that detects the position of an irradiation spot of the illumination light on the screen (11). The apparatus for measuring a scanning pattern sequentially detects a position of the irradiation spot at predetermined time points with the optical position detector (12) during scanning of the screen (11) to measure the scanning pattern of the illumination light.
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