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DISPOSITIF DE SUPPORT DE MESURE, SYSTÈME ENDOSCOPIQUE ET PROCESSEUR
专利权人:
FUJIFILM Corporation
发明人:
申请号:
EP18775941.0
公开号:
EP3603477A1
申请日:
2018.03.05
申请国别(地区):
EP
年份:
2020
代理人:
摘要:
In a measurement support device according to an aspect, in a case where an indicator figure (marker) is displayed in the vicinity of a spot position, since the indicator figure is displayed in different aspects between a case where measurement of a specific region by the displayed indicator figure is effective and a case where measurement of a specific region by the displayed indicator figure is not effective, it is possible to easily grasp effectiveness of measurement by the display aspect of the indicator figure, and thus effective measurement can be easily performed. In addition, in the above-described aspect, since the indicator figure having a size set according to the position of the spot is displayed, distance measurement is not necessary, the configuration is simple, and the processing load is low. Further, since the indicator figure is displayed in the vicinity of the position of the spot, the difference between the spot position and the marker position is small and thus the indicator figure is accurate as an indicator, and since the indicator figure is not displayed in a wide range, the processing load is low.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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