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INSPECTION APPARATUS, SENSING APPARATUS, SENSITIVITY CONTROL APPARATUS, INSPECTION METHOD, AND PROGRAM
专利权人:
Sony Corporation
发明人:
Takashima Masatoshi,Murakami Yoshihiro,Mori Hiroshi
申请号:
US201615575529
公开号:
US2018136116(A1)
申请日:
2016.06.10
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
The present disclosure relates to an inspection apparatus, a sensing apparatus, a sensitivity control apparatus, an inspection method, and a program that perform inspection with improved accuracy. The inspection apparatus includes a detection section for detecting a plurality of different wavelength region components of ambient light reflected from an inspection target to be inspected, and a control section for controlling the sensitivity of each of the different wavelength region components. The control section controls the sensitivity by calculating a histogram indicating the detection level in every wavelength region of light reflected from the inspection target that is detected by the detection section, and determining, based on histograms of particular spectroscopic components, whether or not the sensitivity is properly set for the detection section. The present technology is applicable, for example, to an inspection apparatus that inspects vegetation.
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中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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