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X-RAY DIAGNOSTIC APPARATUS
专利权人:
发明人:
Akihito TAKAHASHI,Haruki Iwai
申请号:
US15921109
公开号:
US20180263587A1
申请日:
2018.03.14
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An X-ray diagnostic apparatus comprises: an X-ray detector including a first detector and a second detector capable of simultaneously detecting X-rays irradiated from an X-ray tube and processing circuitry configured to correct, by using information of a second image that is based on an output from the second detector, a first image that is based on an output from the first detector.
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中国工程科技知识中心
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