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DISPOSITIF DE MESURE OPTIQUE, PROCÉDÉ DE MESURE OPTIQUE, ET PROGRAMME DE MESURE OPTIQUE
专利权人:
NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY;国立大学法人静岡大学
发明人:
NIWAYAMA, Masatsugu,庭山雅嗣
申请号:
JPJP2017/028489
公开号:
WO2018/030314A1
申请日:
2017.08.04
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
Provided is an optical measurement device, which: among light which has been irradiated upon a measurement subject which is formed with a plurality of layers which include a surface layer and a deep layer, in order that the light which has passed through the surface layer is received, receives light at a first position which is removed from a light irradiation position by a first prescribed distance, and in order that the light which has passed through the surface layer and the deep layer is received, receives light at a second position which is removed from the irradiation position by a second prescribed distance; calculates a correction coefficient on the basis of a degree of change of absorbance of the light which has been received at the first position and the second position before and after a change is imparted to blood flow in the surface layer; and, on the basis of the degree of change of the absorbance of the light which has been received at the second position after the change has been imparted to the blood flow in the surface layer, the correction coefficient, and the degree of change of the absorbance of the light which has been received at the second position after a change has been imparted to the blood flow in the surface layer and the deep layer, computes a degree of change of absorbance in the deep layer.La présente invention concerne un dispositif de mesure optique, qui : parmi de la lumière qui a été irradiée sur un objet de mesure qui est formé d'une pluralité de couches qui comprennent une couche de surface et une couche profonde, afin que la lumière qui est passée à travers la couche de surface soit reçue, reçoit la lumière au niveau d'une première position qui est retirée d'une position d'irradiation de lumière par une première distance prescrite, et afin que la lumière qui est passée à travers la couche de surface et la couche profonde soit reçue, reçoit la lumière au niveau d'une seconde position qui est retirée de la position d'irradiation
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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