The present invention relates to an examination apparatus and a corresponding method to realize a Spectral x-ray imaging device through inverse-geometry CT. The proposed examination apparatus comprises: - an X-ray source unit (14) comprising a plurality of X-ray sources (15) for emitting X-rays (24) at a plurality of locations, - an X-ray detection unit (18) for detecting X-rays emitted from one or more of said X-ray sources (15) after penetration of an examination area (19) between said X-ray source unit (14) said X-ray detection unit (18) and for generating detection signals,
