您的位置: 首页 > 农业专利 > 详情页

X-RAY PANORAMIC IMAGING APPARATUS
专利权人:
VATECH Co., Ltd.;VATECH EWOO Holdings Co., Ltd.
发明人:
Chang-Joon RO
申请号:
US15519144
公开号:
US20170231582A1
申请日:
2015.10.13
申请国别(地区):
US
年份:
2017
代理人:
摘要:
The present invention relates to a panoramic X-ray imaging apparatus capable of obtaining more accurate panoramic X-ray images while minimizing the rotation of a rotation arm, the panoramic X-ray imaging apparatus includes at least one X-ray source configured to irradiate X-rays and an X-ray sensor configured to receive the X-rays, a rotating arm configured to position the X-ray sensor and the X-ray source to face each other, a driver configured to rotate the rotating arm about a rotating shaft, a guide configured to provide directions for moving the X-ray sensor or the X-ray source, and wherein the at least one X-ray source is of an electric field emission type adopting an emitter of a nanostructure material and the X-ray source or the X-ray sensor is relatively movable along the guide in conjunction with a movement of the rotating arm.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充