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MEASUREMENT DEVICE AND MEASUREMENT METHOD
专利权人:
HAMAMATSU PHOTONICS K.K.
发明人:
Yoshinori MATSUI,Kazutaka SUZUKI,Haruyoshi TOYODA,Munenori TAKUMI,Naotoshi HAKAMATA
申请号:
US15105088
公开号:
US20160317033A1
申请日:
2014.11.14
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An eyeblink measurement system 10 is a measurement apparatus for measuring a subject's eyelid position, and includes a lighting device 1 that irradiates light extending across upper to lower eyelids of the subject's eye region E, and an image measurement device 2 that has an optical axis Ia on a plane for which a plane including an irradiation optical axis La of the light is rotated by a predetermined angle θ around an axis A1 along the light to be irradiated onto the subject, obtains height information based on the position of an optical image of the light in an image imaged, and measures the eyelid position based on the height information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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