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X-ray imaging apparatus and X-ray imaging method
专利权人:
キヤノン株式会社
发明人:
向出 大平,野間 敬,福田 一徳,渡邉 壮俊,高田 一広
申请号:
JP2010159886
公开号:
JP5213923B2
申请日:
2010.07.14
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
An X-ray imaging apparatus acquiring a differential phase contrast image of a test object without using a light-shielding mask for X-ray. The apparatus includes an X-ray source, a splitting element configured to spatially divide an X-ray emitted from an X-ray source and a scintillator configured to emit light when a divided X-ray beam divided at the splitting element is incident on the scintillator. The apparatus also includes a light-transmission limiting unit configured to limit transmitting amount of the light emitted from the scintillator and a plurality of light detectors each configured to detect the amount of light that has transmitted through the light-transmission limiting unit. The light-transmission limiting unit is configured such that a light intensity detected at each of the light detectors changes in response to a change in an incident position of the X-ray beam.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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